Pragmatic Evaluation of Process Corners in ULP Subthreshold Circuits With Quantum Confinement Effects in Junctionless Nanowire Transistor
Nivedita Rai; Sandeep Semwal; Rohit Kumar Nirala; Abhinav Kranti
- Published
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Journal / collection
- IEEE Transactions on Circuits and Systems I: Regular Papers
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1109/tcsi.2023.3328584
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Cite this source
Nivedita Rai; Sandeep Semwal; Rohit Kumar Nirala; Abhinav Kranti. Pragmatic Evaluation of Process Corners in ULP Subthreshold Circuits With Quantum Confinement Effects in Junctionless Nanowire Transistor. IEEE Transactions on Circuits and Systems I: Regular Papers. 2024-01. https://doi.org/10.1109/tcsi.2023.3328584