LSTM-based framework for predicting point defect percentage in semiconductor materials using simulated XRD patterns
Mehran Motamedi; Reza Shidpour; Mehdi Ezoji
- Published
- Publisher
- Springer Science and Business Media LLC
- Journal / collection
- Scientific Reports
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1038/s41598-024-75783-6
The original publisher provides the full text and its access options.
Cite this source
Mehran Motamedi; Reza Shidpour; Mehdi Ezoji. LSTM-based framework for predicting point defect percentage in semiconductor materials using simulated XRD patterns. Scientific Reports. 2024-10-17. https://doi.org/10.1038/s41598-024-75783-6