Resistive Switching phenomenon in FD-SOI Ω-Gate FETs: Transistor performance recovery and back gate bias influence
C. Valdivieso; R. Rodriguez; A. Crespo-Yepes; J. Martin-Martinez; M. Nafria
- Published
- Publisher
- Elsevier BV
- Journal / collection
- Solid-State Electronics
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1016/j.sse.2025.109067
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Cite this source
C. Valdivieso; R. Rodriguez; A. Crespo-Yepes; J. Martin-Martinez; M. Nafria. Resistive Switching phenomenon in FD-SOI Ω-Gate FETs: Transistor performance recovery and back gate bias influence. Solid-State Electronics. 2025-04. https://doi.org/10.1016/j.sse.2025.109067