Determining alloy concentration by analyzing dynamic diffraction at strained semiconductor interfaces
Frederik Otto; Laura Niermann; Tore Niermann; Michael Lehmann
- Published
- Publisher
- EDP Sciences
- Journal / collection
- BIO Web of Conferences
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1051/bioconf/202412907017
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Cite this source
Frederik Otto; Laura Niermann; Tore Niermann; Michael Lehmann. Determining alloy concentration by analyzing dynamic diffraction at strained semiconductor interfaces. BIO Web of Conferences. 2024. https://doi.org/10.1051/bioconf/202412907017