48‐4: A Study on Reducing Transistor Electrical Characteristic Inspection Processing Time Using Machine Learning
Hyungjin Lee; Daehong Kim; Jungmoon Lee
- Published
- Publisher
- Wiley
- Journal / collection
- SID Symposium Digest of Technical Papers
- Research area
- AI & compute
- Source type
- Journal article
- DOI
- 10.1002/sdtp.18246
The original publisher provides the full text and its access options.
Cite this source
Hyungjin Lee; Daehong Kim; Jungmoon Lee. 48‐4: A Study on Reducing Transistor Electrical Characteristic Inspection Processing Time Using Machine Learning. SID Symposium Digest of Technical Papers. 2025-06. https://doi.org/10.1002/sdtp.18246