Automatic stress analysis method for semiconductor materials based on dual-wavelength infrared photoelasticity
Quanyan He; Yitao Du; Qinghua Qin; Wei Qiu
- Published
- Publisher
- Elsevier BV
- Journal / collection
- Optics and Lasers in Engineering
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1016/j.optlaseng.2024.108648
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Cite this source
Quanyan He; Yitao Du; Qinghua Qin; Wei Qiu. Automatic stress analysis method for semiconductor materials based on dual-wavelength infrared photoelasticity. Optics and Lasers in Engineering. 2025-01. https://doi.org/10.1016/j.optlaseng.2024.108648