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Research literature / Conference paper

New paradigm of Yield analysis in Big Data and AI Era in Semiconductor Manufacturing

Jeffrey David; Ashutosh Gupta; Rishi Bamb; Said Akar; Jonathan Holt; Andrzej Strojwas; Tomasz Brozek

Published
Publisher
IEEE
Journal / collection
2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
Research area
Semiconductors
Source type
Conference paper
DOI
10.1109/edtm58488.2024.10512106

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Jeffrey David; Ashutosh Gupta; Rishi Bamb; Said Akar; Jonathan Holt; Andrzej Strojwas; Tomasz Brozek. New paradigm of Yield analysis in Big Data and AI Era in Semiconductor Manufacturing. 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM). 2024-03-03. https://doi.org/10.1109/edtm58488.2024.10512106

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