Skip to content
OPEN VARIABLE

Evidence-First Signal Intelligence

Menu

Research literature / Conference paper

Implementation of a versatile and efficient monitoring system in semiconductor high-volume manufacturing

Hongye Gao; Linqiang Ye; Jingfeng Kang; Wei Li; Aijiao Zhu; Xuanyu Ta; Jincheng Pei; Kevin Huang

Published
Publisher
SPIE
Journal / collection
Eighth International Workshop on Advanced Patterning Solutions (IWAPS 2024)
Research area
Semiconductors
Source type
Conference paper
DOI
10.1117/12.3052961

Read the original source ↗

The original publisher provides the full text and its access options.

Cite this source

Hongye Gao; Linqiang Ye; Jingfeng Kang; Wei Li; Aijiao Zhu; Xuanyu Ta; Jincheng Pei; Kevin Huang. Implementation of a versatile and efficient monitoring system in semiconductor high-volume manufacturing. Eighth International Workshop on Advanced Patterning Solutions (IWAPS 2024). 2024-12-10. https://doi.org/10.1117/12.3052961

Download RIS