Programmable Online Bond-Wire Fault Detection and Location Method for Insulated Gate Bipolar Transistor Using Inverter Output Parameters
Jaewook Oh; Inhwan Kim; Inhyeok Hwang; Bowook Choi; Namsu Kim
- Published
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Journal / collection
- IEEE Transactions on Instrumentation and Measurement
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1109/tim.2024.3472910
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Cite this source
Jaewook Oh; Inhwan Kim; Inhyeok Hwang; Bowook Choi; Namsu Kim. Programmable Online Bond-Wire Fault Detection and Location Method for Insulated Gate Bipolar Transistor Using Inverter Output Parameters. IEEE Transactions on Instrumentation and Measurement. 2024. https://doi.org/10.1109/tim.2024.3472910