Electro-Thermal Cosimulation of Vertical One-Transistor–One-Resistor (1T1R) Resistive Random Access Memory and Array
Xingyu Zhai; Erping Li; Yiqun Niu; Da Li; Wenchao Chen
- Published
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Journal / collection
- IEEE Transactions on Electron Devices
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1109/ted.2024.3416424
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Cite this source
Xingyu Zhai; Erping Li; Yiqun Niu; Da Li; Wenchao Chen. Electro-Thermal Cosimulation of Vertical One-Transistor–One-Resistor (1T1R) Resistive Random Access Memory and Array. IEEE Transactions on Electron Devices. 2024-08. https://doi.org/10.1109/ted.2024.3416424