(Invited) Advanced Electronic Characterization of Wide Band Gap Semiconductor Defects at the Nanoscale
Andrew Winchester; Sujitra Pookpanratana
- Published
- Publisher
- The Electrochemical Society
- Journal / collection
- ECS Meeting Abstracts
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1149/ma2024-01321578mtgabs
The original publisher provides the full text and its access options.
Cite this source
Andrew Winchester; Sujitra Pookpanratana. (Invited) Advanced Electronic Characterization of Wide Band Gap Semiconductor Defects at the Nanoscale. ECS Meeting Abstracts. 2024-08-09. https://doi.org/10.1149/ma2024-01321578mtgabs