Prediction of Electrical Characteristics of Fin Field-effect Transistor Devices Based on Simulation Using Deep Learning Method
Xiaoling Lai; Yangming Guo; Qianqiong Wang; YuanJie Lv; Dongliang Chen; Shulong Wang
- Published
- Publisher
- MYU K.K.
- Journal / collection
- Sensors and Materials
- Research area
- AI & compute
- Source type
- Journal article
- DOI
- 10.18494/sam4856
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Cite this source
Xiaoling Lai; Yangming Guo; Qianqiong Wang; YuanJie Lv; Dongliang Chen; Shulong Wang. Prediction of Electrical Characteristics of Fin Field-effect Transistor Devices Based on Simulation Using Deep Learning Method. Sensors and Materials. 2024-11-19. https://doi.org/10.18494/sam4856