Dual-Gate Metal-Oxide-Semiconductor Transistors: Nanoscale Channel Length Scaling and Performance Optimization
Huajian Zheng; Zhuohang Ye; Baiquan Liu; Mengye Wang; Li Zhang; Chuan Liu
- Published
- Publisher
- MDPI AG
- Journal / collection
- Electronics
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.3390/electronics14071257
The original publisher provides the full text and its access options.
Cite this source
Huajian Zheng; Zhuohang Ye; Baiquan Liu; Mengye Wang; Li Zhang; Chuan Liu. Dual-Gate Metal-Oxide-Semiconductor Transistors: Nanoscale Channel Length Scaling and Performance Optimization. Electronics. 2025-03-22. https://doi.org/10.3390/electronics14071257