600V Insulated Gate Bipolar Transistor Design for Improving Breakdown Voltage in Trench Floating P-Well Charge Storage Layer Gate Bipolar Transistor
Lee Chao Chan; Kao Yi Sheng; Yen Shih Keng; Xie Shang Rong; Chien Feng Tso
- Published
- Publisher
- IEEE
- Journal / collection
- 2024 7th International Conference on Electronics, Communications, and Control Engineering (ICECC)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/icecc63398.2024.00016
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Cite this source
Lee Chao Chan; Kao Yi Sheng; Yen Shih Keng; Xie Shang Rong; Chien Feng Tso. 600V Insulated Gate Bipolar Transistor Design for Improving Breakdown Voltage in Trench Floating P-Well Charge Storage Layer Gate Bipolar Transistor. 2024 7th International Conference on Electronics, Communications, and Control Engineering (ICECC). 2024-03-22. https://doi.org/10.1109/icecc63398.2024.00016