Demystifying Defects: Federated Learning and Explainable AI for Semiconductor Fault Detection
Tanish Patel; Ramalingam Murugan; Gokul Yenduri; Rutvij H. Jhaveri; Hichem Snoussi; Tarek Gaber
- Published
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Journal / collection
- IEEE Access
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1109/access.2024.3425226
The original publisher provides the full text and its access options.
Cite this source
Tanish Patel; Ramalingam Murugan; Gokul Yenduri; Rutvij H. Jhaveri; Hichem Snoussi; Tarek Gaber. Demystifying Defects: Federated Learning and Explainable AI for Semiconductor Fault Detection. IEEE Access. 2024. https://doi.org/10.1109/access.2024.3425226