Data-Driven Identification Model of Vulnerable Set for Cascading Failure in Power Grid
Sizhe He; Yuxun Zhou; Yadong Zhou; Jiang Wu; Ting Liu; Xiaohong Guan
- Published
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Journal / collection
- IEEE Transactions on Automation Science and Engineering
- Research area
- Energy & infrastructure
- Source type
- Journal article
- DOI
- 10.1109/tase.2024.3389455
The original publisher provides the full text and its access options.
Cite this source
Sizhe He; Yuxun Zhou; Yadong Zhou; Jiang Wu; Ting Liu; Xiaohong Guan. Data-Driven Identification Model of Vulnerable Set for Cascading Failure in Power Grid. IEEE Transactions on Automation Science and Engineering. 2025. https://doi.org/10.1109/tase.2024.3389455