Analysis of DC Characteristics for Tin Oxide (SnO2) based Thin Film Transistor infused with Nickel Material
Vengidusamy. S; R. Kanagavalli; P. Priya; S. Saravanan; M. Kalaiyarasi
- Published
- Publisher
- IEEE
- Journal / collection
- 2024 Third International Conference on Intelligent Techniques in Control, Optimization and Signal Processing (INCOS)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/incos59338.2024.10527637
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Cite this source
Vengidusamy. S; R. Kanagavalli; P. Priya; S. Saravanan; M. Kalaiyarasi. Analysis of DC Characteristics for Tin Oxide (SnO2) based Thin Film Transistor infused with Nickel Material. 2024 Third International Conference on Intelligent Techniques in Control, Optimization and Signal Processing (INCOS). 2024-03-14. https://doi.org/10.1109/incos59338.2024.10527637