A Method on Improving Fault Coverage of Semiconductor Test Patterns using a Distance Function
Sangseok Lee; Sungjae Lee; Jin-Ho Ahn
- Published
- Publisher
- The Korean Institute of Electrical Engineers
- Journal / collection
- The transactions of The Korean Institute of Electrical Engineers
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.5370/kiee.2024.73.1.186
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Cite this source
Sangseok Lee; Sungjae Lee; Jin-Ho Ahn. A Method on Improving Fault Coverage of Semiconductor Test Patterns using a Distance Function. The transactions of The Korean Institute of Electrical Engineers. 2024-01-31. https://doi.org/10.5370/kiee.2024.73.1.186