Characterization and Experimental Validation of Self Heating in RF LDMOS Transistor using BSIM-BULK Model
Ayushi Sharma; Shivendra Singh Parihar; Yawar Hayat Zarkob; Weike Wang; Kimiko Imura; Praveen Diwedi; Yogesh Singh Chauhan
- Published
- Publisher
- IEEE
- Journal / collection
- 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/edtm58488.2024.10511315
The original publisher provides the full text and its access options.
Cite this source
Ayushi Sharma; Shivendra Singh Parihar; Yawar Hayat Zarkob; Weike Wang; Kimiko Imura; Praveen Diwedi; Yogesh Singh Chauhan. Characterization and Experimental Validation of Self Heating in RF LDMOS Transistor using BSIM-BULK Model. 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM). 2024-03-03. https://doi.org/10.1109/edtm58488.2024.10511315