Bridge-contact resistance method for precise evaluation of electrical contacts of nano-scale semiconductor devices
Jiyeong Yun; Byeong-Gyu Park; Huiyun Jung; Jonghyung Lee; Youngjin Park; Geeyoon Kang; Honghwi Park; Hongsik Park
- Published
- Publisher
- Elsevier BV
- Journal / collection
- Solid-State Electronics
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1016/j.sse.2024.108913
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Cite this source
Jiyeong Yun; Byeong-Gyu Park; Huiyun Jung; Jonghyung Lee; Youngjin Park; Geeyoon Kang; Honghwi Park; Hongsik Park. Bridge-contact resistance method for precise evaluation of electrical contacts of nano-scale semiconductor devices. Solid-State Electronics. 2024-06. https://doi.org/10.1016/j.sse.2024.108913