Reliability of Generative Artificial Intelligence
Jason W. Rupe
- Published
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Journal / collection
- IEEE Reliability Magazine
- Research area
- AI & compute
- Source type
- Journal article
- DOI
- 10.1109/mrl.2024.3430935
The original publisher provides the full text and its access options.
Cite this source
Jason W. Rupe. Reliability of Generative Artificial Intelligence. IEEE Reliability Magazine. 2024-09. https://doi.org/10.1109/mrl.2024.3430935