Atomistic Multiscale Simulation-Based Extraction of Design Margins in Advanced Transistor Architectures
Jun Jung; Geunsang Yoo; Alexander Schmidt; Wonyup Song; Hiroyuki Kubotera; Muralikrishna Raju; Byounghak Lee; Woosung Choi; Anthony Payet; Hiroo Koshimoto; Yasuyuki Kayama; Beom Seo Kim; Chungyeon Lee; Jamin Koo; Joohyun Jeon; Seungmin Lee; Dae Sin Kim
- Published
- Publisher
- IEEE
- Journal / collection
- 2024 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/sispad62626.2024.10733229
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Cite this source
Jun Jung; Geunsang Yoo; Alexander Schmidt; Wonyup Song; Hiroyuki Kubotera; Muralikrishna Raju; Byounghak Lee; Woosung Choi; Anthony Payet; Hiroo Koshimoto; Yasuyuki Kayama; Beom Seo Kim; Chungyeon Lee; Jamin Koo; Joohyun Jeon; Seungmin Lee; Dae Sin Kim. Atomistic Multiscale Simulation-Based Extraction of Design Margins in Advanced Transistor Architectures. 2024 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD). 2024-09-24. https://doi.org/10.1109/sispad62626.2024.10733229