Skip to content
OPEN VARIABLE

Evidence-First Signal Intelligence

Menu

Research literature / Journal article

Digital Twin-Based Resilience and Risk Mitigation Strategy for Semiconductor Supply Chains

Muralidhar D; Sooryanivash J. S; Gurpreet Paul; Aravind R

Published
Publisher
MAT Journals
Journal / collection
Journal of Recent Activities in Production
Research area
Semiconductors
Source type
Journal article
DOI
10.46610/jorap.2025.v10i01.005

Read the original source ↗

The original publisher provides the full text and its access options.

Cite this source

Muralidhar D; Sooryanivash J. S; Gurpreet Paul; Aravind R. Digital Twin-Based Resilience and Risk Mitigation Strategy for Semiconductor Supply Chains. Journal of Recent Activities in Production. 2025. https://doi.org/10.46610/jorap.2025.v10i01.005

Download RIS