Development of the Bipolar Junction Transistor Diagnostic Test (BJTDT) to explore the second-year undergraduate Myanmar electronic and Thai electrical engineering students’ understanding of BJT working principles and applications
Myat Noe Khin; Suchai Nopparatjamjomras; Ratchapak Chittaree; Thasaneeya Ratanaroutai Nopparatjamjomras
- Published
- Publisher
- Informa UK Limited
- Journal / collection
- Australasian Journal of Engineering Education
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1080/22054952.2024.2347792
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Cite this source
Myat Noe Khin; Suchai Nopparatjamjomras; Ratchapak Chittaree; Thasaneeya Ratanaroutai Nopparatjamjomras. Development of the Bipolar Junction Transistor Diagnostic Test (BJTDT) to explore the second-year undergraduate Myanmar electronic and Thai electrical engineering students’ understanding of BJT working principles and applications. Australasian Journal of Engineering Education. 2024-01-02. https://doi.org/10.1080/22054952.2024.2347792