Avalanche Breakdown in the Base-Emitter- Shorted Silicon Avalanche Transistor Affected by Voltage Ramp
Long Hu; Hanqing Qiao; Jiahui Fu; Xiangyu Wang; Huan Wang; Xiaoshuai Wu; Xu Fang
- Published
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Journal / collection
- IEEE Transactions on Electron Devices
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1109/ted.2024.3519056
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Cite this source
Long Hu; Hanqing Qiao; Jiahui Fu; Xiangyu Wang; Huan Wang; Xiaoshuai Wu; Xu Fang. Avalanche Breakdown in the Base-Emitter- Shorted Silicon Avalanche Transistor Affected by Voltage Ramp. IEEE Transactions on Electron Devices. 2025-02. https://doi.org/10.1109/ted.2024.3519056