A novel approach for detecting sensor-based semiconductor fault yield classification using convolutional neural networks
Mohammed Altaf Ahmed; Suleman Alnatheer
- Published
- Publisher
- Institute of Advanced Engineering and Science
- Journal / collection
- Indonesian Journal of Electrical Engineering and Computer Science
- Research area
- AI & compute
- Source type
- Journal article
- DOI
- 10.11591/ijeecs.v33.i3.pp1448-1464
The original publisher provides the full text and its access options.
Cite this source
Mohammed Altaf Ahmed; Suleman Alnatheer. A novel approach for detecting sensor-based semiconductor fault yield classification using convolutional neural networks. Indonesian Journal of Electrical Engineering and Computer Science. 2024-03-01. https://doi.org/10.11591/ijeecs.v33.i3.pp1448-1464