Automotive semiconductor chips failure and reliability assessment: Identifying critical stressors to support safe and durable automotive systems
Cheng Hong
- Published
- Publisher
- Elsevier BV
- Journal / collection
- Microelectronics Reliability
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1016/j.microrel.2026.116257
The original publisher provides the full text and its access options.
Cite this source
Cheng Hong. Automotive semiconductor chips failure and reliability assessment: Identifying critical stressors to support safe and durable automotive systems. Microelectronics Reliability. 2026-10. https://doi.org/10.1016/j.microrel.2026.116257