Establishing On-Wafer Calibration Standards for the 16-Term Error Model: Application to Silicon High-Frequency Transistor Characterization
Sebastien Fregonese; Thomas Zimmer
- Published
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Journal / collection
- IEEE Journal of Microwaves
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1109/jmw.2024.3413865
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Cite this source
Sebastien Fregonese; Thomas Zimmer. Establishing On-Wafer Calibration Standards for the 16-Term Error Model: Application to Silicon High-Frequency Transistor Characterization. IEEE Journal of Microwaves. 2024-07. https://doi.org/10.1109/jmw.2024.3413865