Enhancing Bias Stress Stability and VTH Recovery of n-Type SnO 2 :Ge Thin Film Transistor
Jay Singh; Suman Gora; V. P. K. Bhashini; Amab Datta
- Published
- Publisher
- IEEE
- Journal / collection
- 2025 IEEE International Reliability Physics Symposium (IRPS)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/irps48204.2025.10983841
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Cite this source
Jay Singh; Suman Gora; V. P. K. Bhashini; Amab Datta. Enhancing Bias Stress Stability and VTH Recovery of n-Type SnO 2 :Ge Thin Film Transistor. 2025 IEEE International Reliability Physics Symposium (IRPS). 2025-03-30. https://doi.org/10.1109/irps48204.2025.10983841