Analysis of Electrical Characteristics Changes Due to Physical Parameter Variations in Dual-Gate Feedback Field Effect Transistor
Hangwook Jeong; Min-Woo Kwon
- Published
- Publisher
- The Institute of Electronics Engineers of Korea
- Journal / collection
- JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.5573/jsts.2025.25.1.1
The original publisher provides the full text and its access options.
Cite this source
Hangwook Jeong; Min-Woo Kwon. Analysis of Electrical Characteristics Changes Due to Physical Parameter Variations in Dual-Gate Feedback Field Effect Transistor. JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE. 2025-02-28. https://doi.org/10.5573/jsts.2025.25.1.1