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Research literature / Conference paper

Interlaboratory and NIST terahertz standards comparisons with application to non-contact semiconductor carrier measurements

Edwin J. Heilweil; Hannes Hempel; Timothy J. Magnanelli; Jared Wahlstrand; Steven W. Robey; Daniel M. Harrington; Christine K. McGinn; Christina A. Hacker

Published
Publisher
SPIE
Journal / collection
Ultrafast Phenomena and Nanophotonics XXVIII
Research area
Semiconductors
Source type
Conference paper
DOI
10.1117/12.3001151

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Edwin J. Heilweil; Hannes Hempel; Timothy J. Magnanelli; Jared Wahlstrand; Steven W. Robey; Daniel M. Harrington; Christine K. McGinn; Christina A. Hacker. Interlaboratory and NIST terahertz standards comparisons with application to non-contact semiconductor carrier measurements. Ultrafast Phenomena and Nanophotonics XXVIII. 2024-03-09. https://doi.org/10.1117/12.3001151

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