Zero-defect Solutions for Automotive Semiconductor Devices Manufacturing
CaiganChris Chen; Yushan Chi; Chengdong Xu; Bruce Bao; Jihong Zhang; Xingxing Xu; Jian Huang; Xiaohui Ren; Haibo Liu; Calvin Xiang; Junxian Gao; Tong Lei
- Published
- Publisher
- IEEE
- Journal / collection
- 2025 Conference of Science and Technology of Integrated Circuits (CSTIC)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/cstic64481.2025.11017812
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Cite this source
CaiganChris Chen; Yushan Chi; Chengdong Xu; Bruce Bao; Jihong Zhang; Xingxing Xu; Jian Huang; Xiaohui Ren; Haibo Liu; Calvin Xiang; Junxian Gao; Tong Lei. Zero-defect Solutions for Automotive Semiconductor Devices Manufacturing. 2025 Conference of Science and Technology of Integrated Circuits (CSTIC). 2025-03-24. https://doi.org/10.1109/cstic64481.2025.11017812