Gate-All-Around Silicon Nanowire Field Effect Transistor Behavior at High Gate Voltages
Reza Nekovei; Daryoush Shiri; Amit Verma
- Published
- Publisher
- IEEE
- Journal / collection
- 2024 IEEE 14th International Conference Nanomaterials: Applications & Properties (NAP)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/nap62956.2024.10739711
The original publisher provides the full text and its access options.
Cite this source
Reza Nekovei; Daryoush Shiri; Amit Verma. Gate-All-Around Silicon Nanowire Field Effect Transistor Behavior at High Gate Voltages. 2024 IEEE 14th International Conference Nanomaterials: Applications & Properties (NAP). 2024-09-08. https://doi.org/10.1109/nap62956.2024.10739711