Contact Resistance Compensation and its Impact to Semiconductor Test Yield
Jem Kenneth Elopre; Febus Reidj Cruz; Marloun Sejera
- Published
- Publisher
- IEEE
- Journal / collection
- 2024 IEEE 4th International Conference on Electronic Communications, Internet of Things and Big Data (ICEIB)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/iceib61477.2024.10602725
The original publisher provides the full text and its access options.
Cite this source
Jem Kenneth Elopre; Febus Reidj Cruz; Marloun Sejera. Contact Resistance Compensation and its Impact to Semiconductor Test Yield. 2024 IEEE 4th International Conference on Electronic Communications, Internet of Things and Big Data (ICEIB). 2024-04-19. https://doi.org/10.1109/iceib61477.2024.10602725