Demonstration of bias scheme for ferroelectric field-effect transistor (FeFET) based AND array operation
Shinhee Kim; Jae Yeon Park; Dong Keun Lee; Hyungju Noh; Tae-Hyeon Kim; Sihyun Kim; Sangwan Kim
- Published
- Publisher
- Elsevier BV
- Journal / collection
- Solid-State Electronics
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1016/j.sse.2024.108917
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Cite this source
Shinhee Kim; Jae Yeon Park; Dong Keun Lee; Hyungju Noh; Tae-Hyeon Kim; Sihyun Kim; Sangwan Kim. Demonstration of bias scheme for ferroelectric field-effect transistor (FeFET) based AND array operation. Solid-State Electronics. 2024-06. https://doi.org/10.1016/j.sse.2024.108917