Revealing Dielectric's Degradation Effect on Charge Transport in Dual Gate In–Ga–Zn–O Thin Film Transistor via Accumulation–Depletion Operation Mode
Xichen Chuai; Guanhua Yang; Xinlv Duan; Congyan Lu; Nianduan Lu; Di Geng; Ying Zhao; Jiawei Wang; Ling Li
- Published
- Publisher
- Wiley
- Journal / collection
- physica status solidi (RRL) – Rapid Research Letters
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1002/pssr.202400350
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Cite this source
Xichen Chuai; Guanhua Yang; Xinlv Duan; Congyan Lu; Nianduan Lu; Di Geng; Ying Zhao; Jiawei Wang; Ling Li. Revealing Dielectric's Degradation Effect on Charge Transport in Dual Gate In–Ga–Zn–O Thin Film Transistor via Accumulation–Depletion Operation Mode. physica status solidi (RRL) – Rapid Research Letters. 2025-02-10. https://doi.org/10.1002/pssr.202400350