Semiconductor Wafer Bin Map Defect Pattern Classification based on Transfer Learning Considering Data Class Imbalance
Inyoung Park; Jeeyoung Kim
- Published
- Publisher
- The Korea Academia-Industrial Cooperation Society
- Journal / collection
- Journal of the Korea Academia-Industrial cooperation Society
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.5762/kais.2024.25.5.637
The original publisher provides the full text and its access options.
Cite this source
Inyoung Park; Jeeyoung Kim. Semiconductor Wafer Bin Map Defect Pattern Classification based on Transfer Learning Considering Data Class Imbalance. Journal of the Korea Academia-Industrial cooperation Society. 2024-05-31. https://doi.org/10.5762/kais.2024.25.5.637