Channel thickness effect on the performance of amorphous SiZnSnO semiconductor thin-film transistor with metal capping structure
Ji Ye Lee; Byeong-Kwon Ju; Sang Yeol Lee
- Published
- Publisher
- Springer Science and Business Media LLC
- Journal / collection
- Journal of Materials Science: Materials in Electronics
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1007/s10854-024-13049-7
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Cite this source
Ji Ye Lee; Byeong-Kwon Ju; Sang Yeol Lee. Channel thickness effect on the performance of amorphous SiZnSnO semiconductor thin-film transistor with metal capping structure. Journal of Materials Science: Materials in Electronics. 2024-06. https://doi.org/10.1007/s10854-024-13049-7