Electrically Triggered Domain Wall Movement in Cu 2 Se Semiconductor
Ruifeng Dong; Zhengzhou Wang; Hui Bai; Chenghao Xie; Gangjian Tan; Qingjie Zhang; Jinsong Wu
- Published
- Publisher
- American Chemical Society (ACS)
- Journal / collection
- ACS Applied Materials & Interfaces
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1021/acsami.3c18806
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Cite this source
Ruifeng Dong; Zhengzhou Wang; Hui Bai; Chenghao Xie; Gangjian Tan; Qingjie Zhang; Jinsong Wu. Electrically Triggered Domain Wall Movement in Cu 2 Se Semiconductor. ACS Applied Materials & Interfaces. 2024-03-14. https://doi.org/10.1021/acsami.3c18806