Adhesion measurements of Polyimide to silicon nitride for semiconductor component applications
Moritz Hartleb; Peter Imrich; Johannes Zechner; Thomas Walter; Golta Khatibi
- Published
- Publisher
- IEEE
- Journal / collection
- 2024 47th International Spring Seminar on Electronics Technology (ISSE)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/isse61612.2024.10603751
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Cite this source
Moritz Hartleb; Peter Imrich; Johannes Zechner; Thomas Walter; Golta Khatibi. Adhesion measurements of Polyimide to silicon nitride for semiconductor component applications. 2024 47th International Spring Seminar on Electronics Technology (ISSE). 2024-05-15. https://doi.org/10.1109/isse61612.2024.10603751