Measurement of Electrostatic Potentials in Semiconductor Devices by Off-axis Electron Holography
David Cooper; Victor Boureau
- Published
- Publisher
- Oxford University Press (OUP)
- Journal / collection
- Microscopy and Microanalysis
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1093/mam/ozae044.073
The original publisher provides the full text and its access options.
Cite this source
David Cooper; Victor Boureau. Measurement of Electrostatic Potentials in Semiconductor Devices by Off-axis Electron Holography. Microscopy and Microanalysis. 2024-07. https://doi.org/10.1093/mam/ozae044.073