Impact of charging profiles on cumulative semiconductor damage used in EV chargers
Alexander Palacio; Abraham M. Alcaide; Juan Jose Porras; Hugues Renaudineau; Samir Kouro
- Published
- Publisher
- IEEE
- Journal / collection
- IECON 2024 - 50th Annual Conference of the IEEE Industrial Electronics Society
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/iecon55916.2024.10905799
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Cite this source
Alexander Palacio; Abraham M. Alcaide; Juan Jose Porras; Hugues Renaudineau; Samir Kouro. Impact of charging profiles on cumulative semiconductor damage used in EV chargers. IECON 2024 - 50th Annual Conference of the IEEE Industrial Electronics Society. 2024-11-03. https://doi.org/10.1109/iecon55916.2024.10905799