A Hybrid CNN-SVM Algorithm for Detecting Manufacturing Defects
Betul Karakas; Sinem Kulluk
- Published
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Journal / collection
- IEEE Access
- Research area
- Industrial systems
- Source type
- Journal article
- DOI
- 10.1109/access.2025.3630968
The original publisher provides the full text and its access options.
Cite this source
Betul Karakas; Sinem Kulluk. A Hybrid CNN-SVM Algorithm for Detecting Manufacturing Defects. IEEE Access. 2025. https://doi.org/10.1109/access.2025.3630968