PCM-based Matching Networks with Memory for the Mitigation of Transistor Manufacturing Variations
Kariny Nunes-Maia; Audrey Martin; Pierre Medrel; Pierre Blondy
- Published
- Publisher
- IEEE
- Journal / collection
- 2024 54th European Microwave Conference (EuMC)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.23919/eumc61614.2024.10732392
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Cite this source
Kariny Nunes-Maia; Audrey Martin; Pierre Medrel; Pierre Blondy. PCM-based Matching Networks with Memory for the Mitigation of Transistor Manufacturing Variations. 2024 54th European Microwave Conference (EuMC). 2024-09-24. https://doi.org/10.23919/eumc61614.2024.10732392