Insulated Gate Bipolar Transistor Failure Analysis in Overvoltage Condition
B.C. KOK; M.S. Looi; H.H. Goh
- Published
- Publisher
- Cultech Publishing Sdn. Bhd.
- Journal / collection
- RE&PQJ
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.24084/repqj10.392
The original publisher provides the full text and its access options.
Cite this source
B.C. KOK; M.S. Looi; H.H. Goh. Insulated Gate Bipolar Transistor Failure Analysis in Overvoltage Condition. RE&PQJ. 2024-01-16. https://doi.org/10.24084/repqj10.392