Emissivity Measurements of Vanadium Dioxide Thin Films through the Thermal Wave Resonant Cavity and its Applications in Radiative Thermal Diode and Transistor Simulations
I. Alonzo-Zapata; C. Champeaux; F. Enguehard; J. Ordonez-Miranda; F. Dumas-Bouchiat
- Published
- Publisher
- Elsevier BV
- Journal / collection
- International Journal of Heat and Mass Transfer
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1016/j.ijheatmasstransfer.2024.125298
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Cite this source
I. Alonzo-Zapata; C. Champeaux; F. Enguehard; J. Ordonez-Miranda; F. Dumas-Bouchiat. Emissivity Measurements of Vanadium Dioxide Thin Films through the Thermal Wave Resonant Cavity and its Applications in Radiative Thermal Diode and Transistor Simulations. International Journal of Heat and Mass Transfer. 2024-06. https://doi.org/10.1016/j.ijheatmasstransfer.2024.125298