Study of Electrical Characteristics with different Channel lengths of Bottom gate oxide Semiconductor based Thin Film Transistor
Basavaraj S. Sannakashappanavar; Arjun Sunil Rao; Aniruddh Bahadur Yadav; Shreyansh Khatri; Rahul Garg; Kumar Prabhat
- Published
- Publisher
- IEEE
- Journal / collection
- 2024 IEEE Silchar Subsection Conference (SILCON 2024)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/silcon63976.2024.10910520
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Cite this source
Basavaraj S. Sannakashappanavar; Arjun Sunil Rao; Aniruddh Bahadur Yadav; Shreyansh Khatri; Rahul Garg; Kumar Prabhat. Study of Electrical Characteristics with different Channel lengths of Bottom gate oxide Semiconductor based Thin Film Transistor. 2024 IEEE Silchar Subsection Conference (SILCON 2024). 2024-11-15. https://doi.org/10.1109/silcon63976.2024.10910520