Digital twin-based test-time adaptation for robust visual perception in manufacturing
Seung Yeop Ha; Jae Hun Hwang; Jun-Seok Yun; Jong Pil Yun; Jun-Geol Baek; Hong-In Won
- Published
- Publisher
- Elsevier BV
- Journal / collection
- Engineering Applications of Artificial Intelligence
- Research area
- Industrial systems
- Source type
- Journal article
- DOI
- 10.1016/j.engappai.2026.115415
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Cite this source
Seung Yeop Ha; Jae Hun Hwang; Jun-Seok Yun; Jong Pil Yun; Jun-Geol Baek; Hong-In Won. Digital twin-based test-time adaptation for robust visual perception in manufacturing. Engineering Applications of Artificial Intelligence. 2026-10. https://doi.org/10.1016/j.engappai.2026.115415