Analyzing Threats and Detecting Trojans Through Formal Analysis in a Semiconductor 3PIP
Gulam Ashrafi; Chris Dunn; Fred Roberts
- Published
- Publisher
- SAE International
- Journal / collection
- SAE Technical Paper Series
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.4271/2025-01-8085
The original publisher provides the full text and its access options.
Cite this source
Gulam Ashrafi; Chris Dunn; Fred Roberts. Analyzing Threats and Detecting Trojans Through Formal Analysis in a Semiconductor 3PIP. SAE Technical Paper Series. 2025-04-01. https://doi.org/10.4271/2025-01-8085