Assessment of Leakage Current Reduction Techniques for Si-Stacked Nanosheet Transistor at 3-nm Node and Beyond
Mohamed Saleh; Hamdy Abdelhamid; Amr M. Bayoumi
- Published
- Publisher
- IEEE
- Journal / collection
- 2024 6th Novel Intelligent and Leading Emerging Sciences Conference (NILES)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/niles63360.2024.10753173
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Cite this source
Mohamed Saleh; Hamdy Abdelhamid; Amr M. Bayoumi. Assessment of Leakage Current Reduction Techniques for Si-Stacked Nanosheet Transistor at 3-nm Node and Beyond. 2024 6th Novel Intelligent and Leading Emerging Sciences Conference (NILES). 2024-10-19. https://doi.org/10.1109/niles63360.2024.10753173